@article {876156, title = {Effect of layer thickness on device response of silicon heavily supersaturated with sulfur}, journal = {AIP Advances}, volume = {6}, number = {055307}, year = {2016}, author = {Hutchinson, David and Mathews, Jay and Sullivan, Joseph T. and Akey, Austin J. and Michael J. Aziz and Tonio Buonassisi and Persans, Peter D. and Warrender, Jeffrey} }