Citation:
J.T. Sullivan, C.B. Simmons, J.J. Krich, A.J. Akey, D. Recht, M. J. Aziz, and T. Buonassisi. 2013. “Methodology for vetting heavily doped semiconductors for intermediate band photovoltaics: A case study in sulfur-hyperdoped silicon.” J. Appl. Phys., 114, Pp. 103701.
 | mja239_0.pdf | 1.36 MB |