@article {876156,
	title = {Effect of layer thickness on device response of silicon heavily supersaturated with sulfur},
	journal = {AIP Advances},
	volume = {6},
	number = {055307},
	year = {2016},
	author = {Hutchinson, David and Mathews, Jay and Sullivan, Joseph T. and Akey, Austin J. and Michael J. Aziz and Tonio Buonassisi and Persans, Peter D. and Warrender, Jeffrey}
}
