Interferrometric measurement of the pressure-enhanced crystallization rate of amorphous Si
Publication information:
G.-Q. Lu, E. Nygren, M. J. Aziz, D. Turnbull, and C.W. White. 1989. “Interferrometric Measurement of the Pressure-Enhanced Crystallization Rate of Amorphous Si”. Appl. Phys. Lett., 54, Pp. 2583-85