Citation:
J.T. Sullivan, R.G. Wilks, M. T. Winkler, L. Weinhardt, D. Recht, A. J. Said, B. K. Newman, Y. Zhang, M. Blum, S. Krause, W.L. Yang, C. Heske, M. J. Aziz, M. Bär, and T. Buonassisi. 2011. “Soft X-Ray Emission Spectroscopy Studies of the Electronic Structure of Silicon Supersaturated with Sulfur.” Appl. Phys. Lett., 99, 142102.
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