Soft X-ray emission spectroscopy studies of the electronic surface of silicon supersaturated with sulfur
Publication information:
J.T. Sullivan, R.G. Wilks, M. T. Winkler, L. Weinhardt, D. Recht, A. J. Said, B. K. Newman, Y. Zhang, M. Blum, S. Krause, W.L. Yang, C. Heske, M. J. Aziz, M. Bär, and T. Buonassisi. 2011. “Soft X-Ray Emission Spectroscopy Studies of the Electronic Surface of Silicon Supersaturated With Sulfur”. Appl. Phys. Lett., 99, Pp. 142102