Time-Resolved Measurements of Stress Effects on Solid-Phase Epitaxy of Intrinsic and Doped Si
Publication information:
W. Barvosa-Carter and M. J. Aziz. 2001. “Time-Resolved Measurements of Stress Effects on Solid-Phase Epitaxy of Intrinsic and Doped Si”. Appl. Phys. Lett., 79, Pp. 356-58