Time-resolved reflectivity measurement of the pressure-enhanced crystallization rate of amorphous Si in a diamond anvil cell
Publication information:
G.-Q. Lu, E. Nygren, M. J. Aziz, D. Turnbull, and C.W. White. 1988. “Time-Resolved Reflectivity Measurement of the Pressure-Enhanced Crystallization Rate of Amorphous Si in a Diamond Anvil Cell”. Mater. Res. Soc. Symp. Proc., 100, Pp. 435-40